发明名称 THICK-FILM RESISTOR STRUCTURE AND ITS PRODUCTION PROCESS
摘要 <p><P>PROBLEM TO BE SOLVED: To realize a Pb-free, low-resistance thick-film resistor structure exhibiting superior temperature characteristics (TCR). <P>SOLUTION: The thick-film resistor structure is produced by dispersing a conductive material into an insulating material. Crystal of an oxide compound containing calcium and silicon is deposited in the thick-film resistor structure. Crystal of the oxide compound is acicular crystal. In order to deposit the crystal, temperature rise rate is controlled during calcination, when the thick film resistor structure is produced by calcinating thick-film resistor paste. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006229166(A) 申请公布日期 2006.08.31
申请号 JP20050044645 申请日期 2005.02.21
申请人 TDK CORP 发明人 IGARASHI KATSUHIKO;TANAKA HIROBUMI
分类号 H01C7/00;H01B1/14;H01B13/00;H01C17/06 主分类号 H01C7/00
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