发明名称 CIRCUIT ELEMENT MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide detection of an error source such as contact abnormality using a simple method that does not require a specific circuit for contact check. SOLUTION: In a circuit element measuring apparatus including a signal generating unit 10 that applies voltage to an element DUT to be measured, a current detection unit 20 that detects current flowing through the element DUT to be measured, a voltage detection unit 30 that measures the voltage between the both terminal of the element DUT to be measured and a control unit 50 that calculates a predetermined element constant from the detected current and voltage, the control unit 50 including a voltage determining unit 31 that outputs a voltage abnormality signal when the detected voltage of the voltage detection unit 30 is at a predetermined threshold value or less, and a current determining unit 21 that outputs a current abnormality signal when the detected current of the current detection unit 20 is at a predetermined threshold value or less, determines the quality of the contact condition of a source terminal Hc, at the Hi side of the signal generating unit 10 side, or a sense terminal Hp, at the Hi side of the voltage detection unit 30 side, to the element DUT to be measured and the quality of the element DUT to be measured itself. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009002857(A) 申请公布日期 2009.01.08
申请号 JP20070165331 申请日期 2007.06.22
申请人 HIOKI EE CORP 发明人 YAMAGUCHI TSUTOMU;TAGUCHI KEIICHI;TERAJIMA TAKAYUKI;TANAKA HIDEAKI
分类号 G01R27/02 主分类号 G01R27/02
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