SEMICONDUCTOR MEMORY DEVICE FOR EASILY FINDING OUT POSITION OF FAILED MEMORY CELL

摘要

PURPOSE: A semiconductor memory device is provided to easily discriminate whether a defect memory cell places in a main memory block or in a redundancy block by selectively cutting off the redundancy block after packaging the memory device for testing. CONSTITUTION: The device includes a redundancy memory cell block(20,30), a row redundancy selection signal generator(42), a column redundancy selection signal generator(51) and a redundancy block breaking signal generator(60). The redundancy memory cell block has spare memory cells to be replaced with defect memory cells in a main memory cell block(10). The row redundancy selection signal generator generates a row redundancy selection signal for replacing a defect row including the defect cell with a redundancy row in the redundancy memory cell block. The column redundancy selection signal generator generates a column redundancy selection signal for replacing a defect column including the defect cell with a redundancy column in the redundancy memory cell block. The redundancy block breaking signal generator generates a redundancy block breaking signal breaking the redundancy memory cell block by disabling the row redundancy selection signal and the column redundancy selection signal.