发明名称 |
Wetting current diagnostics |
摘要 |
A method of providing wetting current diagnostics for a load control switch includes changing test switch settings of a detection circuit from an operational configuration to a testing configuration. The test switch settings specify respective states of first and second test switches of the detection circuit. The first and second test switches are connected to a node of the detection circuit through which, in the operational configuration, a wetting current for the load control switch flows. The method includes determining whether a voltage at the node becomes no longer indicative of the operational configuration as a result of the changed test switch settings, returning the test switch settings to the operational configuration, and providing a wetting current fault indication if the voltage at the node fails to return to a level indicative of the operational configuration after returning the test switch settings to the operational configuration. |
申请公布号 |
US9465075(B2) |
申请公布日期 |
2016.10.11 |
申请号 |
US201414473799 |
申请日期 |
2014.08.29 |
申请人 |
FREESCALE SEMICONDUCTOR, INC. |
发明人 |
Edwards William E.;Andresen Anthony F. |
分类号 |
G01R31/02;G01R31/327;G01R31/00 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of providing wetting current diagnostics for a load control switch, the method comprising:
changing test switch settings of a detection circuit from an operational configuration to a testing configuration, the test switch settings specifying respective states of first and second test switches of the detection circuit, the first and second test switches being connected to a node of the detection circuit through which, in the operational configuration, a wetting current for the load control switch flows; determining whether a voltage at the node becomes no longer indicative of the operational configuration as a result of the changed test switch settings; returning the test switch settings to the operational configuration; and providing a wetting current fault indication if the voltage at the node fails to return to a level indicative of the operational configuration after returning the test switch settings to the operational configuration. |
地址 |
Austin TX US |