发明名称 Wetting current diagnostics
摘要 A method of providing wetting current diagnostics for a load control switch includes changing test switch settings of a detection circuit from an operational configuration to a testing configuration. The test switch settings specify respective states of first and second test switches of the detection circuit. The first and second test switches are connected to a node of the detection circuit through which, in the operational configuration, a wetting current for the load control switch flows. The method includes determining whether a voltage at the node becomes no longer indicative of the operational configuration as a result of the changed test switch settings, returning the test switch settings to the operational configuration, and providing a wetting current fault indication if the voltage at the node fails to return to a level indicative of the operational configuration after returning the test switch settings to the operational configuration.
申请公布号 US9465075(B2) 申请公布日期 2016.10.11
申请号 US201414473799 申请日期 2014.08.29
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 Edwards William E.;Andresen Anthony F.
分类号 G01R31/02;G01R31/327;G01R31/00 主分类号 G01R31/02
代理机构 代理人
主权项 1. A method of providing wetting current diagnostics for a load control switch, the method comprising: changing test switch settings of a detection circuit from an operational configuration to a testing configuration, the test switch settings specifying respective states of first and second test switches of the detection circuit, the first and second test switches being connected to a node of the detection circuit through which, in the operational configuration, a wetting current for the load control switch flows; determining whether a voltage at the node becomes no longer indicative of the operational configuration as a result of the changed test switch settings; returning the test switch settings to the operational configuration; and providing a wetting current fault indication if the voltage at the node fails to return to a level indicative of the operational configuration after returning the test switch settings to the operational configuration.
地址 Austin TX US
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