发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus comprising an illumination system (IL) for providing a projection beam of radiation (PB), a support structure (MT) for supporting patterning means (MA), the patterning means (MA) serving to impart the projection beam (PB) with a pattern in its cross-section. The apparatus further comprises a substrate table (WT) for holding a substrate (W), a projection system (PL) for projecting the patterned beam onto a target portion of the substrate (W), and a collector (1; 101; 201) which is arranged for transmitting radiation (R), received from a first radiation source (SO), to the illumination system (IL). The apparatus comprises at least a heater (2; 102; 202) for heating the collector (1; 101; 201) when the collector receives substantially no radiation from the first radiation source (SO). <??>The invention further provides a device manufacturing method as well as a device manufactured thereby. <IMAGE>
申请公布号 EP1555575(A1) 申请公布日期 2005.07.20
申请号 EP20050075105 申请日期 2005.01.14
申请人 ASML NETHERLANDS B.V. 发明人 MOORS, J.H.J.;FRANKEN, J.C.L.;MICKAN, UWE;VOORMA, HARM-JAN
分类号 G02B17/00;G03F7/20;H01L21/027 主分类号 G02B17/00
代理机构 代理人
主权项
地址