发明名称 Test partitioning for a non-volatile memory
摘要 Systems and methods are provided for testing a non-volatile memory, such as a flash memory. The non-volatile memory may be virtually partitioned into a test region and a general purpose region. A test application may be stored in the general purpose region, and the test application can be executed to run a test of the memory locations in the test region. The results of the test may be stored in the general purpose region. At the completion of the test, the test results may be provided from the general purpose region and displayed to a user. The virtual partitions may be removed prior to shipping the electronic device for distribution.
申请公布号 US9472285(B2) 申请公布日期 2016.10.18
申请号 US201414204162 申请日期 2014.03.11
申请人 APPLE INC. 发明人 Byom Matthew J.;Wakrat Nir J.;Herman Kenneth L.
分类号 G06F9/44;G11C16/06;G11C29/08;G11C29/12;G11C16/04 主分类号 G06F9/44
代理机构 Van Court & Aldridge LLP 代理人 Van Court & Aldridge LLP
主权项 1. A method of testing non-volatile memory via an interface comprising a flash translation layer and a test region access layer, the method comprising: creating a removable virtual test partition within a non-volatile memory; performing a test, using the test region access layer, on the removable virtual test partition, the performing comprising: erasing a portion of the non-volatile memory contained in the removable virtual partition;programming a test pattern to a sub-portion of the erased portion;performing a read operation on the sub-portion; anddetermining whether the read operation produces the test pattern; removing the removable virtual test partition; and accessing the non-volatile memory using the flash translation layer after the removable virtual test partition has been removed.
地址 Cupertino CA US