发明名称 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD AND ELECTRONIC COMPONENT
摘要 <P>PROBLEM TO BE SOLVED: To provide a heat-resistant negative photosensitive resin composition also having good sensitivity and resolution, a pattern forming method using the composition in which the composition is developable with an alkaline aqueous solution and excels in sensitivity, resolution and heat resistance and by which a pattern of a good shape is obtained, and to provide high-reliability electronic components. <P>SOLUTION: The negative photosensitive resin composition is spin-coated and dried on a semiconductor substrate 1 on which a first conductor layer 3, a second conductor layer 7 and an interlayer insulating film 4 have been formed, and light is illuminated through a mask of a pattern for forming a window 6C in a predetermined portion. After development with an alkaline aqueous solution, heating (curing) is carried out to form a surface protective film 8. The negative photosensitive resin composition comprises (a) an alkaline aqueous solution-soluble polymer having phenolic hydroxyl groups at terminals, (b) a compound which generates an acid upon irradiation with an actinic ray, and (c) a compound which is crosslinked or polymerized by the action of an acid. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006189788(A) 申请公布日期 2006.07.20
申请号 JP20050276496 申请日期 2005.09.22
申请人 HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD 发明人 MINEGISHI TOMONORI
分类号 G03F7/038;G03F7/004;G03F7/037;G03F7/11;H01L21/027 主分类号 G03F7/038
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