发明名称 CONTACT PIN, PROBE CARD USING IT, AND ELECTRONIC COMPONENT TEST APPARATUS
摘要 A contact pin (50) to be in contact with a terminal of a wafer for supplying a signal to the wafer comprises a first conductive layer (51b) composed of a first conductive material having a relatively high hardness compared to an oxide coating film formed on the terminal, a second conductive layer (51c) composed of a second conductive material having a relatively low hardness compared to the oxide coating film, and a base (51a) on the outer side of which the first conductive layer (51b) and the second conductive layer (51c) are formed. The first conductive layer (51b) is formed in close contact with the outer side of the second conductive layer (51c), and both the first conductive layer (51b) and the second conductive layer (51c) are exposed in the front end face (50a) of the contact pin (50).
申请公布号 KR20060086263(A) 申请公布日期 2006.07.31
申请号 KR20057024156 申请日期 2005.12.16
申请人 ADVANTEST CORP. 发明人 KUROTORI FUMIO;ISHIKAWA TAKAJI;SAITO TADAO
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
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