发明名称 |
TWO-STEP PROJECTING BUMP FOR SEMICONDUCTOR CHIP AND METHOD FOR FORMING THE SAME |
摘要 |
<p>In a two-staged projecting bump formed on an electrode (4) of a semiconductor element (8) in a method of melting a leading end of a metallic wire (1) passed through a capillary (3) thereby forming a metallic ball (2); bonding the metallic ball to the electrode of the semiconductor element; moving the capillary sideways and downward; bonding the metallic wire onto the metallic ball bonded to the electrode of the metallic wire; and pulling and breaking the metallic wire, wherein a metallic wire part (B) immediately above the metallic ball where crystal grains are thermally influenced and turned coarse when the leading end of the metallic wire is melted thereby forming the metallic ball is located inside a boundary where the bonding between the metallic ball and the metallic wire terminates. <IMAGE></p> |
申请公布号 |
EP0895281(A1) |
申请公布日期 |
1999.02.03 |
申请号 |
EP19970917401 |
申请日期 |
1997.04.16 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
TSUKAHARA, NORIHITO |
分类号 |
H01L21/321;H01L21/60;H01L23/485;(IPC1-7):H01L21/321 |
主分类号 |
H01L21/321 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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