Time delay evaluation

摘要

The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method includes the steps: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modeling a first probability distribution (P 1 ) of the evaluated time delays (TD); obtaining a second probability distribution (P 2 ) of the evaluated time delays (TD); performing a statistical transformation in order to obtain a third probability distribution (P 3 ) of the evaluated time delays (TD); and deciding to pass the device under test, if a certain percentage of the area of the third probability distribution (P 3 ) is on a good side (GS) of the test limit (TL 2 ).