发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method which can selectively etch any of a plurality of silicon oxide films of different types.SOLUTION: According to one embodiment, a semiconductor device manufacturing method includes the steps of: forming on a substrate, a first silicon oxide film having a first carbon content; forming on the first silicon oxide film, a second silicon oxide film having a second carbon content different form the first carbon content; and selectively etching the first or second silicon oxide film by using a bromine-or-chlorine-containing gas.SELECTED DRAWING: Figure 2
申请公布号 JP2016174013(A) 申请公布日期 2016.09.29
申请号 JP20150051995 申请日期 2015.03.16
申请人 TOSHIBA CORP 发明人 YAMAMOTO HIROSHI;OMURA MITSUHIRO
分类号 H01L21/3065;H01L21/3213;H01L21/336;H01L21/768;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/3065
代理机构 代理人
主权项
地址
您可能感兴趣的专利