发明名称 High freuency semiconductor switch and wireless device
摘要 A high frequency semiconductor switch has a first terminal, second terminals, a first through FET group, second through FET groups and a shunt FET group. The first through FET group has first field effect transistors connected serially with each other. One end of the first through FET group is connected to the first terminal. Each of the second through FET groups has second field effect transistors connected serially with each other. One end of each of the second through FET groups is connected to each of the second terminals. The other end of each of the second through FET groups is commonly connected to the other end of the first through FET group. The shunt FET group has third field effect transistors connected serially with each other between the second terminal and a ground terminal.
申请公布号 US9461643(B2) 申请公布日期 2016.10.04
申请号 US201514928879 申请日期 2015.10.30
申请人 Kabushiki Kaisha Toshiba 发明人 Kunishi Yugo;Seshita Toshiki
分类号 H03K17/693;H01L27/12;H03K17/10;H01L29/423;H01L29/78;H04B1/52 主分类号 H03K17/693
代理机构 White & Case LLP 代理人 White & Case LLP
主权项 1. A high frequency semiconductor switch, comprising: a first terminal; a plurality of second terminals; a first through FET group having a plurality of first field effect transistors connected serially with each other, one end of the first through FET group being connected to the first terminal; a plurality of second through FET groups, each of the second through FET groups having a plurality of second field effect transistors connected serially with each other, one end of each of the second through FET groups being connected to each of the second terminals, the other end of each of the second through FET groups being commonly connected to the other end of the first through FET group; and a shunt FET group having a plurality of third field effect transistors connected serially with each other between the second terminal and a ground terminal, wherein, in the case where n is a number of the first field effect transistors of the first through FET group,the number n of the first field effect transistors is selected such that a voltage between a source and a drain of each of the first field effect transistors is not greater than a breakdown voltage of the first field effect transistors, when the first through FET group and the second through FET groups are not in a conductive state wherein the number n is an integer.
地址 Tokyo JP