| 摘要 |
<p>The presence of trace materials in a sample (30) is detected using both macroscopic and microscopic properties. A detector includes a light source (25) and an optical resonator. The light source may be located either inside the resonance cavity of the resonator or outside the cavity, in which case it may be a semi-conductor such as a semi-conductor laser or a superluminescent diode. The detector also includes at least one reflective member (24) that has a total internal reflection (TIR) surface (26) and may be a passive device or an active gain element. Light from the light source is preferably focussed onto a single point of reflection on the TIR surface. The test sample is positioned within the evanescent field region of the TIR surface. Optical changes arising within the evanescent field region, such as excitation of fluorescence in the sample, changes in its refractive index, and changes in the resonant frequency of the optical resonator, are then detected. These changes are then sensed to determine the amount or at least presence of analyte located at the TIR surface. <IMAGE></p> |
