发明名称 |
METHODS AND SYSTEMS FOR DETECTOR GAP CORRECTIONS |
摘要 |
Methods and systems are provided for correcting positional errors in an image arising from gaps in a detector assembly. In one embodiment, a method comprises generating a sinogram based on a plurality of photon coincidence events, selectively inserting one or more pseudo-slices into the sinogram, and generating an image based on the sinogram including the one or more pseudo-slices. In this way, positional errors may be reduced without modifying an image reconstruction algorithm to include a full detector geometry or modifying the detector geometry itself. |
申请公布号 |
US2016267687(A1) |
申请公布日期 |
2016.09.15 |
申请号 |
US201514658066 |
申请日期 |
2015.03.13 |
申请人 |
General Electric Company |
发明人 |
Matthews Christopher Gerald |
分类号 |
G06T11/00;G01T1/29;G06T7/00;G01T1/202 |
主分类号 |
G06T11/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method, comprising:
generating a sinogram based on a plurality of photon coincidence events; selectively inserting one or more pseudo-slices into the generated sinogram to generate an updated sinogram, wherein each of the one or more pseudo-slices comprises a blank, functional slice; and generating an image based on the updated sinogram including the one or more pseudo-slices. |
地址 |
Schenectady NY US |