发明名称 Performance evaluation of solid state memory device
摘要 Embodiments relate methods and computer program products for performance testing of a solid state memory devices. The method includes operating a first solid state memory device for a period of time and capturing state information of the first solid state memory device after the period of time. The method also includes storing the state information in a control file and loading the control file onto a second solid state memory device. Once the control file has been loaded into the second solid state memory device the state information can be adapted to fix any issues due to physical variation. Performance testing can then be preformed on the second solid state memory device without preconditioning the second solid state memory device.
申请公布号 US9524800(B2) 申请公布日期 2016.12.20
申请号 US201213627483 申请日期 2012.09.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Griffin Thomas J.;VanStee Dustin J.
分类号 G06F11/08;G11C29/04;G06F11/14;G11C29/40 主分类号 G06F11/08
代理机构 Cantor Colburn LLP 代理人 Cantor Colburn LLP ;McNamara Margaret A.
主权项 1. A method for performance testing of solid state memory devices, the method comprising: operating, by a processor, a first solid state memory device for a period of time, wherein operating includes reading and writing user data to the first solid state memory device; capturing state information of the first solid state memory device after the period of time, wherein the state information includes only a program-erase cycle count and a logical to physical mapping table and wear leveling data, and does not include user data written to the first solid state memory device; storing the state information in a control file; loading the control file onto a second solid state memory device; performing performance testing on the second solid state memory device; loading the control file onto a third solid state memory device; and adapting the state information to correct errors due to physical variation, wherein adapting comprises: discovering one or more bad blocks in one or more locations; andseeding the third solid state memory device with valid data based on a mapping table.
地址 Armonk NY US