发明名称 Voltage reference with low sensitivty to package shift
摘要 In a bandgap voltage reference with low package shift, a proportional to absolute temperature (PTAT) voltage is generated using a single diode biased at two different current levels at two different times. Using the same diode for both current density measurements removes the absolute value of the base-emitter junction voltage (Vbe) and any package shift in the PTAT voltage. The bandgap voltage reference can be implemented in a single or differential circuit topology. In some implementations, the bandgap voltage reference can include circuitry for curvature correction.
申请公布号 US9501078(B2) 申请公布日期 2016.11.22
申请号 US201514691432 申请日期 2015.04.20
申请人 Atmel Corporation 发明人 Manea Danut;Kotowski Jeff;Fritz Scott N.;Wang Yongliang
分类号 G05F3/30;G05F3/08 主分类号 G05F3/30
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. A bandgap voltage reference circuit, comprising: a bias voltage generator circuit for generating a proportional to absolute temperature (PTAT) voltage, the bias voltage generator circuit including a first PTAT current source configured to be coupled to a diode during a first phase of operation and a second PTAT current source configured to be coupled to the diode during a second phase of operation, where the first PTAT current source is configured for providing a higher current level than the second PTAT current source and where the first and second phases occur at different times; a measurement circuit configured to be coupled to the first PTAT current source during the first phase of operation for measuring a base-emitter junction voltage (Vbe) of the diode and to be coupled to the second PTAT current source during the second phase of operation for measuring a shift in Vbe (ΔVbe); a bandgap voltage generator circuit configured to be coupled to the measurement circuit during the second phase of operation for generating a bandgap voltage based on ΔVbe; a first set of switches that are operable during the first phase of operation to couple the measurement circuit to the bias voltage generator circuit; and a second set of switches that during the second phase of operation are operable to couple the measured voltages to the bandgap voltage generator circuit, where the second set of switches are open when the first set of switches are closed and vice-versa, wherein the first and second sets of switches are commanded closed or open based on four clock signals, a first clock signal, a delayed version of the first clock signal, a second clock signal and a delayed version of the second clock signal.
地址 San Jose CA US