| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit for reducing the development man-hours of a test program for inspecting AC characteristics and reducing the test time of AC characteristic inspection. SOLUTION: A three-input selector is provided at the data of a flip-flop at an initial stage for receiving signals for ensuring AC characteristics. Input 1, input 2, and input 3 of the selector are set to be data in the normal case, data via the delay of set-up time from the reference clock of AC characteristics, and data via the delay of hold time from the reference clock of AC characteristics, respectively. Then, an output data compressor 20, an expectation value storage register 21, and a comparator 22 are provided to the output of an initial stage flip-flop 16, and the self-inspection of the semiconductor integrated circuit can be made. The development period of the test program, and test time can be greatly reduced by the self inspection. COPYRIGHT: (C)2005,JPO&NCIPI
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