Noise measurement system

摘要

Apparatuses and methods for measuring flicker noise are disclosed. In one embodiment, a noise measurement system may include a first circuit path configured to drive a first terminal of a device under test (DUT) in the noise measurement system, a charging circuit path configured to charge the first terminal of the DUT in a setup phase, and logic configured to charge the first terminal of the DUT to a predetermined voltage using the first circuit path and the charging circuit path in the setup phase.

主权项

1. A noise measurement system, comprising:
a first circuit path configured to drive a first terminal of a device under test (DUT) in the noise measurement system; a charging circuit path configured to charge the first terminal of the DUT in a setup phase; logic configured to charge the first terminal of the DUT to a predetermined voltage using the first circuit path and the charging circuit path in the setup phase, wherein the logic configured to charge the first terminal of the DUT comprises logic configured to monitor a first current in the first circuit path and monitoring a charging current in the charging path, logic configured to determine whether the first terminal of the DUT has reached the predetermined voltage based on the first current and the charging current, and logic configured to disconnect the charging circuit path in response to the first terminal of the DUT has reached the predetermined voltage; and logic configured to perform noise measurements on the DUT in a measurement phase.