发明名称 COMPOUND SEMICONDUCTOR DEVICES HAVING BURIED RESISTORS FORMED IN BUFFER LAYER
摘要 Structures and methods are provided for fabricating a semiconductor device (e.g., III-V compound semiconductor device) having buried resistors formed within a buffer layer of the semiconductor device. For instance, a semiconductor device includes a buffer layer disposed on a substrate, a channel layer disposed on the buffer layer, and a buried resistor disposed within the buffer layer. The buffer and channel layers may be formed of compound semiconductor materials such as III-V compound semiconductor materials. Utilizing the buffer layer of a compound semiconductor structure to form buried resistors provides a space-efficient design with increased integration density since the resistors do not have to occupy a large amount of space on the active surface of a semiconductor integrated circuit chip.
申请公布号 US2016358905(A1) 申请公布日期 2016.12.08
申请号 US201514732174 申请日期 2015.06.05
申请人 International Business Machines Corporation 发明人 Balakrishnan Karthik;Cheng Kangguo;Hashemi Pouya;Reznicek Alexander
分类号 H01L27/06;H01L49/02;H01L21/8234 主分类号 H01L27/06
代理机构 代理人
主权项 1. A method for fabricating a semiconductor device, comprising: forming a buffer layer on a substrate; forming a channel layer on the buffer layer; and forming a buried resistor within the buffer layer.
地址 Armonk NY US