发明名称 |
COMPOUND SEMICONDUCTOR DEVICES HAVING BURIED RESISTORS FORMED IN BUFFER LAYER |
摘要 |
Structures and methods are provided for fabricating a semiconductor device (e.g., III-V compound semiconductor device) having buried resistors formed within a buffer layer of the semiconductor device. For instance, a semiconductor device includes a buffer layer disposed on a substrate, a channel layer disposed on the buffer layer, and a buried resistor disposed within the buffer layer. The buffer and channel layers may be formed of compound semiconductor materials such as III-V compound semiconductor materials. Utilizing the buffer layer of a compound semiconductor structure to form buried resistors provides a space-efficient design with increased integration density since the resistors do not have to occupy a large amount of space on the active surface of a semiconductor integrated circuit chip. |
申请公布号 |
US2016358905(A1) |
申请公布日期 |
2016.12.08 |
申请号 |
US201514732174 |
申请日期 |
2015.06.05 |
申请人 |
International Business Machines Corporation |
发明人 |
Balakrishnan Karthik;Cheng Kangguo;Hashemi Pouya;Reznicek Alexander |
分类号 |
H01L27/06;H01L49/02;H01L21/8234 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a semiconductor device, comprising:
forming a buffer layer on a substrate; forming a channel layer on the buffer layer; and forming a buried resistor within the buffer layer. |
地址 |
Armonk NY US |