发明名称 半導体装置
摘要 A semiconductor device including a non-volatile memory cell including a writing transistor which includes an oxide semiconductor, a reading transistor which includes a semiconductor material different from that of the writing transistor, and a capacitor is provided. Data is written or rewritten to the memory cell by turning on the writing transistor and supplying a potential to a node where a source electrode (or a drain electrode) of the writing transistor, one electrode of the capacitor, and a gate electrode of the reading transistor are electrically connected to each other, and then turning off the writing transistor so that the predetermined amount of charge is held in the node. Further, when a transistor whose threshold voltage is controlled and set to a positive voltage is used as the reading transistor, a reading potential is a positive potential.
申请公布号 JP6007265(B2) 申请公布日期 2016.10.12
申请号 JP20150003863 申请日期 2015.01.13
申请人 株式会社半導体エネルギー研究所 发明人 山崎 舜平;小山 潤;加藤 清
分类号 H01L21/8242;G11C11/405;H01L21/336;H01L21/8234;H01L21/8247;H01L27/06;H01L27/088;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/8242
代理机构 代理人
主权项
地址