发明名称 PHOTOMASK
摘要 <P>PROBLEM TO BE SOLVED: To suppress decrease in pattern resolution caused by an exposure light component incident not perpendicular to a photomask surface. <P>SOLUTION: A major surface of a transparent substrate 11 made of quartz, calcium fluoride or the like transparent to exposure light has recesses patterned by engraving the surface, and a light shielding film 12 is disposed in the recess. The area where the light shielding film 12 is formed serves as a light shielding section, while an area where a light shielding film is not formed serves as a light transmitting section. This significantly decreases the quantity of transmitted light of exposure light, which may be blocked by the light shielding film 12 if a conventional structure is used. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008310092(A) 申请公布日期 2008.12.25
申请号 JP20070158326 申请日期 2007.06.15
申请人 SHIN ETSU CHEM CO LTD 发明人 KANEKO HIDEO
分类号 G03F1/32;G03F1/54;G03F1/68;H01L21/027 主分类号 G03F1/32
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