发明名称 SINTERED POLYCRYSTALLINE GALLIUM NITRIDE
摘要 Polycrystalline gallium nitride (GaN) characterized by having the atomic fraction of gallium ranging from between about 49% to 55%, an apparent density of between about 5.5 and 6.1 g/cm<3>, and a Vickers hardness of above about 1 GPa. Polycrystalline GaN can be made by hot isostatic pressing (HIPing) at a temperature ranging from about 1150° C. to 1300° C. and a pressure ranging from between about 1 and 10 Kbar. Alternatively, polycrystalline GaN can be made by high pressure/high temperature (HP/HT) sintering at a temperature ranging from about 1200° to 1800° C. and a pressure ranging from about 5 to 80 Kbar.
申请公布号 KR100903251(B1) 申请公布日期 2009.06.17
申请号 KR20047006467 申请日期 2002.10.30
申请人 发明人
分类号 C01G15/00;C04B35/58;B28B3/00;C01B;C01B21/06;C23C;C23C14/34;H01L21/20;H01L33/00;(IPC1-7):C01G15/00 主分类号 C01G15/00
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