发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>A semiconductor device and a fabricating method thereof are provided to protect a MOS transistor against overvoltage by forming a protection element having a junction region which breaks down a junction region of the MOS transistor eairlier. A MOS transistor(1) is formed in a semiconductor layer(3), and first junction regions(32,33) are formed between the semiconductor layer and diffusion layers included in the MOS transistor. A protection element is disposed around a formation region of the MOS transistor, and has second junction regions(34,35) having a junction breakdown voltage lower than that of the first junction region. Isolation regions(4,5) divide the semiconductor layer into plural regions and the MOS transistor is formed in one of the regions.</p>
申请公布号 KR20070104833(A) 申请公布日期 2007.10.29
申请号 KR20070037330 申请日期 2007.04.17
申请人 SANYO ELECTRIC CO., LTD. 发明人 OTAKE SEIJI
分类号 H01L21/761;H01L29/78 主分类号 H01L21/761
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