发明名称 ELECTRODE FOR PHASE CHANGE MEMORY, METHOD OF FORMING THE ELECTRODE, AND PHASE CHANGE MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an electrode for a phase change memory, the method of forming the electrode, and the phase change memory. SOLUTION: An electrode 100 for a memory material for the phase change memory comprises: a first layer 110 joined on a memory material 102 containing nitride (AN<SB>x</SB>), where A is one of Ti and W and x is smaller than 1.0; and a second layer 114 joined on the first layer 110 containing nitride (AN<SB>y</SB>), where y is equal to or larger than 1.0. The first layer 110 of this multi-layer electrode is joined on a chalcogenide based memory material 102 such as GST stronger than stochiometric TiN or WN. As a result, interlaminar peeling is prevented. A substrate 116 has a diode 120 internally, such as a diode (lower) electrode 118 for connecting a PNP diode to the (lower) surface 122 of the memory material 102. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007243180(A) 申请公布日期 2007.09.20
申请号 JP20070046465 申请日期 2007.02.27
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 KEITH KWONG HON WONG;MAUTHE RONALD;COTE DONNA R
分类号 H01L27/105;H01L45/00 主分类号 H01L27/105
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