| 摘要 |
PURPOSE: A semiconductor chip test socket is provided to stably contact a contact terminal of an object to be inspected. CONSTITUTION: A guide body(300) is combined with the upper side of a socket body. A clip(400) has a rectangular parallelepiped body, a head part, and a receiving part. The head part is projected from the upper part of the body part. A probe projection is formed on the upper end of the head part. A receiving part is depressed on the lower part of the body. The clip is coupled with the coupling hole of the guide body. |
