| 摘要 |
PROBLEM TO BE SOLVED: To provide an LSI device capable of being individually tested on internal circuit blocks. SOLUTION: This LSI device is provided with one input terminal, one output terminal, a first circuit block receiving external signals via the input terminal, a second circuit block connected to the output side of the first circuit block and feeding outputs to the output terminal, a test circuit arranged on the connecting path of the first and second circuit blocks, a test output circuit arranged on the connecting path of the second circuit block and the output terminal, a first connecting path connecting the input terminal to the test circuit by detouring the first circuit block, a second connecting path connecting the output of the first circuit block to the test output circuit by detouring the test circuit and the second circuit block, and a mode setting circuit outputting a signal instructing the switching of the connecting path to the test circuit and the test output circuit.
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