发明名称 |
Thin-film transistor and process for manufacture of the thin-film transistor |
摘要 |
A thin-film transistor includes an oxidic semiconductor channel, a metallic or oxidic gate, drain and source contacts and at least one barrier layer positioned between the oxidic semiconductor channel and the drain and source contacts to inhibit an exchange of oxygen between the oxidic semiconductor channel and the drain and source contacts. |
申请公布号 |
US9425321(B2) |
申请公布日期 |
2016.08.23 |
申请号 |
US201414515579 |
申请日期 |
2014.10.16 |
申请人 |
UNIVERSITAET STUTTGART |
发明人 |
Herrmann Marcus;Fruehauf Norbert |
分类号 |
H01L21/321;H01L29/786;H01L21/465;H01L21/467;H01L27/12;H01L29/45;H01L29/66 |
主分类号 |
H01L21/321 |
代理机构 |
|
代理人 |
Striker Michael J. |
主权项 |
1. A thin-film transistor, comprising:
an oxidic semiconductor channel; metallic or oxidic gate, drain and source contacts; and multiple barrier layers positioned between the oxidic semiconductor channel and the drain and source contacts to inhibit an exchange of oxygen between the oxidic semiconductor channel and the drain and source contacts; wherein one of the barrier layers is formed from a subtractively structured conductive layer in direct contact with the oxidic semiconductor channel; and wherein another of the barrier layers is formed of an electrical insulator comprising silicon oxide or silicon nitride. |
地址 |
Stuttgart DE |