发明名称 SEMICONDUCTOR STRUCTURE WITH DATA STORAGE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor structure and a method for forming the same are provided. The semiconductor structure includes a substrate and a gate structure formed over the substrate. The semiconductor structure further includes a first source/drain structure and a second source/drain structure formed in the substrate adjacent to the gate structure. The semiconductor structure further includes an interlayer dielectric layer formed over the substrate to cover the gate structure, the first source/drain structure, and the second source/drain structure. The semiconductor structure further includes a first conductive structure formed in the interlayer dielectric layer over the first source/drain structure. The semiconductor structure further includes a second conductive structure formed in the interlayer dielectric layer over the second source/drain structure. In addition, the first conductive structure is in direct contact with the first source/drain structure, and the second conductive structure is not in direct contact with the second source/drain structure.
申请公布号 US2016240775(A1) 申请公布日期 2016.08.18
申请号 US201514885035 申请日期 2015.10.16
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 HSIAO Woan-Yun;KING Ya-Chin;LIN Chrong-Jung;CHEN Huang-Kui;CHANG Tzong-Sheng
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A semiconductor structure, comprising: a substrate; a gate structure formed over the substrate; a first source/drain structure and a second source/drain structure formed in the substrate adjacent to the gate structure; an interlayer dielectric layer formed over the substrate to cover the gate structure, the first source/drain structure, and the second source/drain structure; a first conductive structure formed in the interlayer dielectric layer over the first source/drain structure; and a second conductive structure formed in the interlayer dielectric layer over the second source/drain structure, wherein the first conductive structure is in direct contact with the first source/drain structure, and the second conductive structure is not in direct contact with the second source/drain structure.
地址 Hsinchu TW