发明名称 Instrument for measuring flatness or uniformity of curvature
摘要 An instrument for determining the profile of a surface. Two hinge plates are attached to each other at a hinge joint. A collimated light source on one of the hinge plates produces a spot on a position sensitive photo detector on the other hinge plate. An electrical circuit is provided to produce an electrical signal based on the relative position of the spot as the instrument flexes as it is slid along the surface. In preferred embodiments the electrical signal is a measure of the surface profile or the change in slope of the profile.
申请公布号 US5269070(A) 申请公布日期 1993.12.14
申请号 US19920962850 申请日期 1992.10.19
申请人 THURSTON, WM. H. 发明人 THURSTON, WM. H.
分类号 G01B11/24;G01B11/30;(IPC1-7):G01B11/24 主分类号 G01B11/24
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