| 摘要 |
In a method for assessing the thickness of a measuring object (A), light is emitted towards the object, and the intensity of the light transmitted through the object is measured, resulting in a measurement curve (Y). The measurement curve is compared with a calibration curve (P), which has been determined in similar fashion for a calibration object, in order to identify at least one interval of the measurement curve within which the intensity varies in the same manner as within one interval of the calibration curve. The average value of the intensity in the respective intervals is determined, and the thickness of the object is assessed on the basis of a comparison between the average values. Alternatively, one identifies at least one interval of the measurement curve including points of either the highest or the lowest intensity in the curve. The average value of the intensity in this interval is determined and is compared with the average value of the intensity in at least one interval of the calibration curve, this interval including points of either the highest or the lowest intensity in the calibration curve. A device for implementing the method is also disclosed.
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