发明名称 MEASURING WEAVELENGTH CHANGE
摘要 An optical wavelength analyser including: an entrance slit (4) for receiving a light beam (3) including signals with various wavelengths and passing the beam at least partly; a diffractor (6, 7, 9) for receiving the passed beam and diffracting the signals dependent on their wavelength; a detector (8) including adjacent detector elements (32, 33, 35, 36, 38, 39) for receiving the diffracted signals and generating their output signals; a processor (21) for determining the wavelengths from the output signals, in which the received light beam has a spatially uniform intensity; the diffractor diffracts each signal on a different detector element subset, consisting of at least a first element (32, 33, 35, 36, 38, 39) for receiving at least a first signal with a first signal level; the processor determines each signal's wavelength dependent on the first signal level and a calibration value.
申请公布号 WO0184097(A1) 申请公布日期 2001.11.08
申请号 WO2001NL00327 申请日期 2001.05.01
申请人 NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETEN-SCHAPPELIJK ONDERZOEK TNO;CHENG, LUN, KAI 发明人 CHENG, LUN, KAI
分类号 G01J3/02;G01J3/14;G01J3/28;G01J9/00;(IPC1-7):G01J3/02 主分类号 G01J3/02
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