发明名称 CALIBRATION METHOD OF POSITION MEASURING ARRANGEMENT
摘要 PROBLEM TO BE SOLVED: To provide a calibration method of a position measuring arrangement, capable of easily measuring position of a planar object using a camera at a low cost. SOLUTION: The method includes a first stage where a flat plate 1 for calibration is provided with a plurality of patterns, a second stage for measuring the position of the pattern relative to the flat plate 1, a third stage where the flat plate 1 is attached to a position detecting device and a plurality of patterns on the flat plate 1 are imaged with a camera 3, and a fourth stage for measuring the position of a plurality of patterns relative to the flat plate 1 based on the image acquired in the third stage. The position of a plurality of patterns acquired in the second stage is compared with the position of a plurality of patterns acquired in the fourth stage, to determine a camera parameter of the camera 3. A small plate 2 on which the pattern is drawn is pasted to the flat plate 1, and the pattern is applied on the flat plate 1. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004361356(A) 申请公布日期 2004.12.24
申请号 JP20030163106 申请日期 2003.06.09
申请人 YASKAWA ELECTRIC CORP 发明人 WAKISAKO HITOSHI;SHIRAISHI KAZUNARI
分类号 G01B11/00;(IPC1-7):G01B11/00 主分类号 G01B11/00
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