发明名称 Method of forming dual gate dielectric layer
摘要 A semiconductor device includes a dual gate dielectric layer that increases a performance of a semiconductor device. The semiconductor device includes a first dielectric layer having a predetermined thickness on a semiconductor substrate. The first dielectric layer is formed on a first region. The semiconductor device also includes a second dielectric layer having a dielectric constant higher than that of the first dielectric layer. The second dielectric layer is formed on both the first region and a second region.
申请公布号 US7439604(B2) 申请公布日期 2008.10.21
申请号 US20060616836 申请日期 2006.12.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO MIN-HEE;KIM JI-YOUNG
分类号 H01L21/336;H01L29/00;H01L21/76;H01L21/762;H01L21/8234 主分类号 H01L21/336
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