| 发明名称 |
System for and method of investigating the exact same point on a sample substrate with multiple wavelengths |
| 摘要 |
Disclosed are system for and method of analyzing a sample at substantially the exact same small spot point on a sample with a plurality of wavelengths.
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| 申请公布号 |
US2007097373(A1) |
申请公布日期 |
2007.05.03 |
| 申请号 |
US20060636786 |
申请日期 |
2006.12.12 |
| 申请人 |
PFEIFFER GALEN L;LIPHARDT MARTIN M;JOHS BLAINE D;HERZINGER CRAIG M;GOEDEN CHRISTOPHER A;HE PING;WOOLLAM JOHN A;WELCH JAMES D |
发明人 |
PFEIFFER GALEN L.;LIPHARDT MARTIN M.;JOHS BLAINE D.;HERZINGER CRAIG M.;GOEDEN CHRISTOPHER A.;HE PING;WOOLLAM JOHN A.;WELCH JAMES D. |
| 分类号 |
G01N21/55;G01J4/00 |
主分类号 |
G01N21/55 |
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