| 发明名称 | Method of identifying direction of stacking in stacked ceramic capacitor | ||
| 摘要 | In a method of identifying a direction of stacking in a stacked ceramic capacitor, while density of magnetic flux generated from a magnetism generation apparatus is measured with a magnetic flux density measurement instrument, a stacked ceramic capacitor is caused to pass between a magnetism generation apparatus and the magnetic flux density measurement instrument and variation in magnetic flux density at least at the time of passage of the stacked ceramic capacitor is measured. Based on a result of measurement of magnetic flux density, a direction in which a plurality of internal electrodes are stacked in the stacked ceramic capacitor is identified. | ||
| 申请公布号 | US9431175(B2) | 申请公布日期 | 2016.08.30 |
| 申请号 | US201314102616 | 申请日期 | 2013.12.11 |
| 申请人 | MURATA MANUFACTURING CO., LTD. | 发明人 | Sasaoka Yoshikazu |
| 分类号 | H01G4/30;H01G4/012 | 主分类号 | H01G4/30 |
| 代理机构 | Keating & Bennett, LLP | 代理人 | Keating & Bennett, LLP |
| 主权项 | 1. A method of identifying a direction of stacking in a stacked ceramic capacitor, the method comprising the steps of: measuring a variation in magnetic flux density at least at a time of passage of the stacked ceramic capacitor by causing the stacked ceramic capacitor to pass between a magnetism generation apparatus and a magnetic flux density measurement instrument while a density of magnetic flux generated from the magnetism generation apparatus is measured with the magnetic flux density measurement instrument; and identifying a direction of stacking of a plurality of internal electrodes in the stacked ceramic capacitor based on a result of measurement of magnetic flux density in the step of measuring a variation in magnetic flux density. | ||
| 地址 | Kyoto JP | ||