SEMICONDUCTOR INTEGRATED CIRCUIT, PLL CIRCUIT, AND ELECTRONIC APPARATUS

摘要

PROBLEM TO BE SOLVED: To differentiate the variation of inductance of each inductor incident to the in state of a sample significantly, while reducing the circuit area.SOLUTION: In a semiconductor integrated circuit (1), a sample (S) can be placed on a protective film (91) located above the surface of a lower side substrate (93) on the side where a first inductor (110) and a second inductor (120) are formed, where the direction from the lower side substrate (93) toward the protective film (91) is the height direction. A first metal layer (ML110) forming the first inductor (110) of an oscillation circuit (11) is located at a higher position than a second metal layer (ML120) forming the second inductor (120) of a divider circuit (12).SELECTED DRAWING: Figure 1