发明名称 Semiconductor memory including circuitry for driving plural word lines in a test mode
摘要 A semiconductor memory includes circuitry for driving plural word lines in a test mode. The semiconductor memory includes a plurality of memory cells; a plurality of word lines connected to the memory cells; a plurality of bit lines connected to the memory cells; and a drive circuit connected to the word lines for, in a test mode, selectively driving all the word lines or, alternatively, driving a select number of word lines.
申请公布号 US5258954(A) 申请公布日期 1993.11.02
申请号 US19920908744 申请日期 1992.07.06
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FURUYAMA, TOHRU
分类号 G11C29/08;G11C29/34;G11C29/50;(IPC1-7):G11C29/00;G11C8/00 主分类号 G11C29/08
代理机构 代理人
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