发明名称 OXIDE SEMICONDUCTOR FILM AND SEMICONDUCTOR DEVICE
摘要 It is an object to provide a highly reliable semiconductor device with good electrical characteristics and a display device including the semiconductor device as a switching element. In a transistor including an oxide semiconductor layer, a needle crystal group provided on at least one surface side of the oxide semiconductor layer grows in a c-axis direction perpendicular to the surface and includes an a-b plane parallel to the surface, and a portion except for the needle crystal group is an amorphous region or a region in which amorphousness and microcrystals are mixed. Accordingly, a highly reliable semiconductor device with good electrical characteristics can be formed.
申请公布号 US2016218226(A1) 申请公布日期 2016.07.28
申请号 US201615090937 申请日期 2016.04.05
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 YAMAZAKI Shunpei;SAKAKURA Masayuki;WATANABE Ryosuke;SAKATA Junichiro;AKIMOTO Kengo;MIYANAGA Akiharu;HIROHASHI Takuya;KISHIDA Hideyuki
分类号 H01L29/786;H01L29/04;H01L29/24 主分类号 H01L29/786
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP