发明名称 FOREIGN SUBSTANCE ANALYSIS SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a foreign substance analysis system that can easily and accurately analyze foreign substances in a sample.SOLUTION: The foreign substance analysis system includes the steps of: acquiring infrared spectrum information on a sample S measured by an infrared spectrophotometer 10 (step 31a); acquiring fluorescent X-ray spectrum information on the sample S measured by a fluorescent X-ray analyzer 20 (step 31b); and determining the presence of organic elements in the sample S by comparing the ratio of the intensity of the Compton scattering line and the intensity of the Rayleigh scattered line in the fluorescent X-ray spectrum information to a set threshold (step 31d).SELECTED DRAWING: Figure 1
申请公布号 JP2016176817(A) 申请公布日期 2016.10.06
申请号 JP20150057291 申请日期 2015.03.20
申请人 SHIMADZU CORP 发明人 MURAKAMI YUKIO;IWASAKI SACHIKO;TSUCHIBUCHI TAKESHI
分类号 G01N23/22;G01N21/3563;G01N23/223 主分类号 G01N23/22
代理机构 代理人
主权项
地址