发明名称 |
FOREIGN SUBSTANCE ANALYSIS SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To provide a foreign substance analysis system that can easily and accurately analyze foreign substances in a sample.SOLUTION: The foreign substance analysis system includes the steps of: acquiring infrared spectrum information on a sample S measured by an infrared spectrophotometer 10 (step 31a); acquiring fluorescent X-ray spectrum information on the sample S measured by a fluorescent X-ray analyzer 20 (step 31b); and determining the presence of organic elements in the sample S by comparing the ratio of the intensity of the Compton scattering line and the intensity of the Rayleigh scattered line in the fluorescent X-ray spectrum information to a set threshold (step 31d).SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016176817(A) |
申请公布日期 |
2016.10.06 |
申请号 |
JP20150057291 |
申请日期 |
2015.03.20 |
申请人 |
SHIMADZU CORP |
发明人 |
MURAKAMI YUKIO;IWASAKI SACHIKO;TSUCHIBUCHI TAKESHI |
分类号 |
G01N23/22;G01N21/3563;G01N23/223 |
主分类号 |
G01N23/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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