发明名称 BIT-ERASING ARCHITECTURE FOR SEEK-SCAN PROBE (SSP) MEMORY STORAGE
摘要 <p>An apparatus comprising a substrate, a heater formed on the substrate, and a phase-change layer formed on the heater. The heater comprises a heater layer and first and second electrodes electrically coupled to the heater layer. A process comprising forming a heater on a substrate and forming a phase-change layer on the heater. The heater comprises a heater layer and first and second electrodes electrically coupled to the heater layer.</p>
申请公布号 KR20090027208(A) 申请公布日期 2009.03.16
申请号 KR20087030503 申请日期 2007.06.26
申请人 INTEL CORP. 发明人 MA QING;RAO VALLURI R.;CHOU TSUNG KUAN ALLEN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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