发明名称 |
Thermally enhanced structure for multi-chip device |
摘要 |
A multi-chip semiconductor device comprises a thermally enhanced structure, a first semiconductor chip, a second semiconductor chip, an encapsulation layer formed on top of the first semiconductor chip and the second semiconductor chip. The multi-chip semiconductor device further comprises a plurality of thermal vias formed in the encapsulation layer. The thermally enhanced structure comprises a heat sink block attached to a first semiconductor die. The heat sink block may further comprise a variety of thermal vias and thermal openings. By employing the thermal enhanced structure, the thermal performance of the multi-chip semiconductor device can be improved. |
申请公布号 |
US9530715(B2) |
申请公布日期 |
2016.12.27 |
申请号 |
US201514851952 |
申请日期 |
2015.09.11 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Yu Chen-Hua;Tung Chih-Hang;Shao Tung-Liang |
分类号 |
H01L23/34;H01L23/367;H01L23/31;H01L23/36;H01L21/48;H01L23/498;H01L23/00;H01L25/065;H01L23/373;H05K1/18;H01L23/532 |
主分类号 |
H01L23/34 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. An apparatus comprising:
a first heat sink on a first side of a first semiconductor die, wherein the first heat sink comprises at least one thermal via and one thermal opening; the first semiconductor die having a second side coupled to an interposer through a plurality of bumps; and a substrate having a first side coupled to the interposer through a plurality of solder balls, wherein the first semiconductor die is placed between the interposer and the substrate and there is an air gap between a non-bonding surface of the first heat sink and the first side of the substrate. |
地址 |
Hsin-Chu TW |