发明名称 |
METHOD OF DEVELOPING E-BEAM RESIST FOR PATTERNING |
摘要 |
<p>An electron beam resist developing method is provided to form a high density pattern with the minimum wiring width by developing an electron beam resist. A substrate coated with an electron beam resist is prepared(S210). The electronic beam is irradiated in the pattern formation part of substrate(S220). The irradiated substrate is developed by a first developer(S230). The impurity is etched on the electron beam resist(S240). The etched substrate is developed by a second developer(S250).</p> |
申请公布号 |
KR100904896(B1) |
申请公布日期 |
2009.06.29 |
申请号 |
KR20080010047 |
申请日期 |
2008.01.31 |
申请人 |
SEOUL NATIONAL UNIVERSITY INDUSTRY FOUNDATION |
发明人 |
KIM, KI BUM;LEE, HYO SUNG |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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