发明名称 Process of forming capacitive insulating film.
摘要 <p>A process of forming a capacitive insulating film comprises the steps of forming a tantalum oxide film through thermochemical reaction involving organic tantalum charge gas and oxygen gas, and subsequently forming a tantalum oxide film through plasma chemical reaction involving tantalum halogenide charge gas and nitrous oxide (N2O) gas, said steps being performed in the same apparatus. &lt;IMAGE&gt;</p>
申请公布号 EP0474140(A1) 申请公布日期 1992.03.11
申请号 EP19910114673 申请日期 1991.08.30
申请人 NEC CORPORATION 发明人 KAMIYAMA, SATOSHI
分类号 H01L27/04;C23C16/40;H01L21/02;H01L21/314;H01L21/316;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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