发明名称 MOS technology capacitor and integrated semiconductor circuit
摘要 This invention relates to a Metal Oxide on Semiconductor technology capacitor and an integrated semiconductor circuit comprising a MOS technology capacitor or a Bipolar Complementary Metal Oxide on Semiconductor technology capacitor comprising said MOS technology capacitor. The integrated MOS technology capacitor is comprising at least one conducting gate layer 1 , preferably a polycrystaline semiconductor layer, at least one insulating layer 2 , preferably a metal oxide layer, adjacent to said gate layer 1 and at least one semiconductor layer 3 adjacent to said metal insulating layer 2 , wherein at least an area of said semiconductor layer 3 is highly doped.
申请公布号 US2005167781(A1) 申请公布日期 2005.08.04
申请号 US20040011162 申请日期 2004.12.15
申请人 ALCATEL 发明人 GERHARDT ERWIN
分类号 H01L21/02;H01L21/334;H01L27/07;H01L29/94;(IPC1-7):H01L29/76 主分类号 H01L21/02
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