发明名称 HYBRID TOPOGRAPHICAL AND CHEMICAL PRE-PATTERNS FOR DIRECTED SELF-ASSEMBLY OF BLOCK COPOLYMERS
摘要 Hybrid pre-patterns were prepared for directed self-assembly of a given block copolymer capable of forming a lamellar domain pattern. The hybrid pre-patterns have top surfaces comprising independent elevated surfaces interspersed with adjacent recessed surfaces. The elevated surfaces are neutral wetting to the domains formed by self-assembly. Material below the elevated surfaces has greater etch-resistance than material below the recessed surfaces in a given etch process. Following other dimensional constraints of the hybrid pre-pattern described herein, a layer of the given block copolymer was formed on the hybrid pre-pattern. Self- assembly of the layer produced a lamellar domain pattern comprising self-aligned, unidirectional, perpendicularly oriented lamellae over the elevated surfaces, and parallel and/or perpendicularly oriented lamellae over recessed surfaces. The domain patterns displayed long range order along the major axis of the pre-pattern. The lamellar domain patterns are useful in forming transfer patterns comprising two-dimensional customized features.
申请公布号 WO2016132248(A1) 申请公布日期 2016.08.25
申请号 WO2016IB50644 申请日期 2016.02.08
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM UNITED KINGDOM LIMITED;IBM (CHINA) INVESTMENT COMPANY LIMITED 发明人 CHENG, Joy;TJIO, Melia;SINGH, Gurpreet;FRIZ, Alexander;SANDERS, Daniel, Paul;TSAI, HsinYu;BRINK, Markus;GUILLORN, Michael;LIU, Chi-Chun;DOERK, Gregory
分类号 H01L21/02;H01L21/311;H01L29/06;H05K3/00 主分类号 H01L21/02
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