发明名称 LIGHT SCATTERING TYPE COMPONENT CONCENTRATION MEASURING APPARATUS AND METHOD
摘要 PURPOSE:To provide a light scattering type component concentration measuring apparatus and method which enables non-destructive measurement of the concentration of a component in material to be measured using light in a near infrared wavelength area with better transmissivity and relatively low energy of light quantum. CONSTITUTION:This apparatus and method is made up of a light irradiation section 1 to irradiate material 16 to be measured with excitation light containing a near infrared wavelength area, a photodetecting section 2 which analyze a Raman scattered light from the material 16 to be measured to detect it and an arithmetic section 3 which calculates the concentration of a component in the material 16 to be measured from the quantity of the Raman scattered light to output the results of the calculation.
申请公布号 JPH0749309(A) 申请公布日期 1995.02.21
申请号 JP19930194653 申请日期 1993.08.05
申请人 KYOTO DAIICHI KAGAKU:KK 发明人 TOU GIYOUMEI;UENOYAMA SEIZO
分类号 G01N21/35;G01N21/65;G01N33/02;G01N33/487;G01N33/497;(IPC1-7):G01N21/65 主分类号 G01N21/35
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