发明名称 |
LIGHT SCATTERING TYPE COMPONENT CONCENTRATION MEASURING APPARATUS AND METHOD |
摘要 |
PURPOSE:To provide a light scattering type component concentration measuring apparatus and method which enables non-destructive measurement of the concentration of a component in material to be measured using light in a near infrared wavelength area with better transmissivity and relatively low energy of light quantum. CONSTITUTION:This apparatus and method is made up of a light irradiation section 1 to irradiate material 16 to be measured with excitation light containing a near infrared wavelength area, a photodetecting section 2 which analyze a Raman scattered light from the material 16 to be measured to detect it and an arithmetic section 3 which calculates the concentration of a component in the material 16 to be measured from the quantity of the Raman scattered light to output the results of the calculation. |
申请公布号 |
JPH0749309(A) |
申请公布日期 |
1995.02.21 |
申请号 |
JP19930194653 |
申请日期 |
1993.08.05 |
申请人 |
KYOTO DAIICHI KAGAKU:KK |
发明人 |
TOU GIYOUMEI;UENOYAMA SEIZO |
分类号 |
G01N21/35;G01N21/65;G01N33/02;G01N33/487;G01N33/497;(IPC1-7):G01N21/65 |
主分类号 |
G01N21/35 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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