发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 A semiconductor memory device according to an embodiment comprises: a memory cell array, the memory cell array including: an inter-layer insulating layer and a conductive layer stacked in a stacking direction; a columnar semiconductor layer having a side surface that faces side surfaces of the inter-layer insulating layer and the conductive layer and extending in the stacking direction; and a block insulating layer and a block high-permittivity layer disposed between the columnar semiconductor layer and the conductive layer, the block insulating layer including: a first block insulating film that covers a side surface of the columnar semiconductor layer from a lower surface of the inter-layer insulating layer to an upper surface of the conductive layer in the stacking direction; and a second block insulating film that contacts the first block insulating film and covers at least a side surface and a lower surface of the conductive layer.
申请公布号 US2016268266(A1) 申请公布日期 2016.09.15
申请号 US201514729544 申请日期 2015.06.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NODA Kotaro;NODA Kyoko
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor memory device, comprising: a memory cell array, the memory cell array including: an inter-layer insulating layer stacked on a semiconductor substrate; a conductive layer stacked on the inter-layer insulating layer; a columnar semiconductor layer having a side surface that faces side surfaces of the inter-layer insulating layer and the conductive layer and extending in a stacking direction of the inter-layer insulating layer and the conductive layer; and a block insulating layer and a block high-permittivity layer disposed between the columnar semiconductor layer and the conductive layer, the block insulating layer including: a first block insulating film that covers a side surface of the columnar semiconductor layer at least from a lower surface of the inter-layer insulating layer to an upper surface of the conductive layer in the stacking direction; and a second block insulating film that contacts the first block insulating film and covers at least a side surface and a lower surface of the conductive layer.
地址 Minato-ku JP