| 摘要 |
PURPOSE: A test handler is provided to prevent the waste of an unnecessary semiconductor device by detecting the semiconductor device remaining on a test board. CONSTITUTION: A handler body comprises a test board(100). A driving part is installed in the handler body. The driving part ascends and descends to the test board. A main bridge is connected to the driving part. The main bridge is separated from the upper side of the test board. The main bridge ascends and descend to the test board according to an operation of the driving part. A sensor(200) senses existence and nonexistence of a remaining semiconductor device. |
