发明名称 IMPLEMENTATION OF A ONE TIME PROGRAMMABLE MEMORY USING A MRAM STACK DESIGN
摘要 An integrated circuit includes a magnetic OTP memory array formed of multiple magnetic OTP memory cells having an MTJ stack with a fixed magnetic layer, a tunnel barrier insulating layer, a free magnetic layer, and a second electrode. When a voltage is applied across the magnetic OTP memory cell, the resistance of the MTJ stack and the gating transistor form a voltage divider to apply a large voltage across the MTJ stack to breakdown the tunnel barrier to short the fixed layer to the free layer. The integrated circuit has multiple MRAM arrays configured such that each of the multiple MRAM arrays have performance and density criteria that match MOS transistor based memory including SRAM, DRAM, and flash memory. The integrated circuit may include a functional logic unit connected with the magnetic OTP memory arrays and the MRAM arrays for providing digital data storage.
申请公布号 WO2016160578(A1) 申请公布日期 2016.10.06
申请号 WO2016US24236 申请日期 2016.03.25
申请人 HEADWAY TECHNOLOGIES, INC. 发明人 JAN, Guenole;WANG, Po-Kang;LEE, Yuan-Jen;ZHU, Jian;LIU, Huanlong
分类号 G11C17/16 主分类号 G11C17/16
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