发明名称 Verfahren und Vorrichtung zur Detektierung des Zustandes einer Polierscheibe
摘要 A single sensor 19 simultaneously measures the thickness and contour of a polishing pad 3 before and after polishing to determine changes in the thickness and contour of the polishing pad 3 caused by polishing. Based on these changes, a reproduction signal for pad reproduction or a replacement signal for pad replacement is output from a controlling means 13 to enable the surface accuracy of the polishing pad to be efficiently controlled. <IMAGE>
申请公布号 DE69708424(T2) 申请公布日期 2002.07.18
申请号 DE1997608424T 申请日期 1997.09.05
申请人 SPEEDFAM-IPEC, INC. 发明人 ARAI, HATSUYUKI;IKEYAMA, YASUSHI
分类号 B24B37/20;B24B37/24;B24B49/04;B24B49/12;B24B53/00;B24B53/017 主分类号 B24B37/20
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